PANalytical revamps its diffractometer

By Gregory Roumeliotis

- Last updated on GMT

Related tags Crystal

Dutch instrumentation specialist PANalytical has added new options
to its X'Pert PRO MPD X-ray diffractometer, providing a total
solution for high throughput diffraction and analysing almost any
material.

The X'Pert PRO MPD was already equipped with automated sample changer and a high speed, high resolution X'Celerator detector which can process hundreds of full scans every day, thus achieving the high throughput required for a growing number of X-ray diffraction applications.

But the newly included programmable XYZ stage is particularly useful for sample mapping and transmission or reflection analysis of samples in well plates.

It is part of the family of exchangeable PreFIX stages and therefore does not need alignment.

"One of the main new features of the diffraction system is the reflection-transmission spinner,"​ PANalytical's Terry Soteriou told In-Pharmatechnologist.com​.

"Before, you could spin the sample just in reflection mode, not in transmission mode, so now you get better statistical representation of the sample and more clearly defined intensities for samples with coarser grains."

Thanks to the PreFIX concept for fast and accurate changing of optical modules and sample stages, the X'Pert PRO MPD system can be easily reconfigured from a high-end system for the crystallographic researcher to a "work horse" for routine measurements.

In addition, the X'Pert Operator Interface, a dedicated software package for automatic measurements, allows customisable well plate grid definition and ease of measurement execution.

Emphasis on the research and development of macromolecules - especially in areas such as protein pharmaceutics - has increased in recent years.

Many macromolecular materials have traditionally been considered 'difficult' for X-ray diffraction because of their weak scattering characteristics and small sample volumes.

Often, however, a lot of effort is put in growing crystals of sufficient size for the single crystal diffractometer.

The power of X-Ray diffraction as the only analytical technique capable of distinguishing crystalline phases is well recognised.

It has long been considered a tool best suited to the laboratory because of its low measurement speed and need for specialist knowledge.

PANalytical will display the X'Pert PRO MPD at Pittcon this March.

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