Malvern Panalytical: Aeris compact X-ray diffractometer
Malvern Panalytical has launched an updated version of its Aeris compact X-ray diffractometer (XRD). The smaller-footprint system, reportedly incorporating features typically found in larger units, enables examination of thin films and (according to the manufacturer) conducts transmission measurements that provide accurate data not affected by sample preparation artefacts.
Wilijan Vissers, Aeris product manager, said, “By providing the data quality of a floor-standing system in a compact instrument, the new Aeris will enable a wider range of our customers to carry out in-depth materials analysis and optimize their processes – helping push the scientific frontier even further forward.”
