Thermo Electron introduces the ARL Quant'X
needs of laboratories dealing with unpredictable samples. It
incorporates a non-destructive analysis with sensitivity at
single-digit ppm levels for most elements and sample types.
The ARL Quant'X is an X-ray product which utilises a Peltier cooled Si(Li) detector and Digital Pulse Processing (DPP) technology for analysis of environmental and industrial applications. This can include studies for air particulates, soil contamination, toxic elements in plastic, and forensic science.
With the DPP technology, the ARL Quant'X improves throughput compared to conventional analog pulse processors. The electrically-cooled Si (Li) detector is now provides elemental coverage with no loss in efficiency that plagues the thinner crystals of SDD and PIN detectors.
Thermo claims the product provides the highest performance-price ratio of all other Energy Dispersive XRF (EDXRF) instruments on the market. It also has the sensitivity and flexibility to satisfy, for example, RoHS and WEEE regulations, according to the firm.
The RoHS (Restriction of the use of certain Hazardous Substances) and WEEE (Waste Electrical & Electronic Equipment) will significantly impact the global electronics industry as component manufacturers and end equipment makers are forced to change their processes to comply with the legislation.
Equipment manufacturers for the food and pharmaceutical industries are understandably concerned about the new legislation coming into force. The worry is that changes in processes might mean delays in product launches, hiking up developmental and testing costs.
The software included with the ARL Quant'X comes with a choice of five algorithms plus bulk and thin-film FP, thereby enabling standardless and semi-standardless capability.
The ethernet technology at the core of the ARL Quant'X allows communication with any computer, desktop or laptop, and enables support for Windows XP and beyond. High-power performance is achieved without traditional nuisance of water cooling, liquid nitrogen or expensive regular maintenance.
Variable beam collimation allows analysis of smaller samples (down to 1mm), while the biggest sample chamber available with any XRF system can accommodate various sample handlers including a 10/20-position auto-sampler and special stages.
